Integrated Charge Pump in 180 nm SOI Technology for a Silicon Drift Detector
Conference title:
Austrian Workshop on Microelectronics (33., 2025, Linz)
Conference title:
Austrochip 2025
Venue:
Linz
Year of conference:
2025
Year:
2025
Language:
Englisch
Abstract:
This paper presents a novel biasing method for a silicon drift detector (SDD). The presented integrated circuit in 180nm silicon-on-insulator (SOI) technology generate negative high-voltages for stable operation of a SDD. The integrated circuit uses a Pelliconi charge pump operating at a frequency of 10MHz, so that voltages of up to −70V are generated with a SDD-typical load current of 25μA. The simulations have been done with open source tools. To satisfy the rigid noise requirements of SDD-based systems thorough frequency-planning has been performed for the analog and digital signal chain. Operating an SDD module with a high-voltage supply based on a charge pump has been shown to be possible with high resolution.
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This paper presents a novel biasing method for a silicon drift detector (SDD). The presented integrated circuit in 180nm silicon-on-insulator (SOI) technology generate negative high-voltages for stable operation of a SDD. The integrated circuit uses a Pelliconi charge pump operating at a frequency of 10MHz, so that voltages of up to −70V are generated with a SDD-typical load current of 25μA. The simulations have been done with open source tools. To satisfy the rigid noise requirements of SDD-bas...
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Department:
Fakultät für Elektrotechnik und Informationstechnik
Institute:
EIT 4 - Institut für Mikroelektronik und Schaltungstechnik