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Authors:
Triftshäuser, Werner; Kögel, Gottfried; Sperr, Peter; Britton, David T.; Uhlmann, K.; Willutzki, Paul 
Document type:
Zeitschriftenartikel / Journal Article 
Title:
A scanning positron microscope for defect analysis in materials science 
Journal:
Nuclear Instruments and Methods in Physics Research Section B 
Volume:
130 
Issue:
1-4 
Year:
1997 
Pages from - to:
264-269 
Language:
Englisch 
Abstract:
The realisation of a scanning positron microscope will be presented and discussed. A positron beam with a variable energy from 0.5 to 30 keV, with a spot diameter of 1 μm or below, can be scanned over an area of 0.6 × 0.6 mm2. This beam is formed after a double stage stochastic cooling (moderation) of positrons emitted from a radioactive isotope. In addition the positron beam will be pulsed in order to have a well-defined time base for positron lifetime measurements. In the system included is a...    »
 
ISSN:
0168-583X 
Department:
Fakultät für Luft- und Raumfahrttechnik 
Institute:
LRT 2 - Institut für angewandte Physik und Messtechnik 
Chair:
Dollinger, Günther 
Open Access yes or no?:
Nein / No