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Autoren:
Steeneken, Peter; Soikkeli, Miika; Arpiainen, Sanna; Rantala, Arto; Jaaniso, Raivo; Pezone, Roberto; Vollebregt, Sten; Lukas, Sebastian; Kataria, Satender; Houmes, Maurits; Álvarez-Diduk, Ruslan; Lee, Kangho; Wasisto, Hutomo Suryo; Anzinger, Sebastian; Fueldner, Marc; Verbiest, Gerard; Alijani, Farbod; Shin, Dong Hoon; Malic, Ermin; van Rijn, Richard; Nevanen, Tarja; Centeno, Alba; Zurutuza, Amaia; van der Zant, Herre; Merkoci, Arben; Duesberg, Georg; Lemme, Max 
Dokumenttyp:
Zeitschriftenartikel / Journal Article 
Titel:
Towards wafer-scale 2D material sensors 
Zeitschrift:
2D Materials 
Jahr:
2025 
Sprache:
Englisch 
Abstract:
The unique properties of two-dimensional (2D) materials bring great promise to improve sensor performance and realise novel sensing principles. However, to enable their high-volume production, wafer-scale processes that allow integration with electronic readout circuits need to be developed. In this perspective, we review recent progress in on-chip 2D material sensors, and compare their performance to the state-of-the-art, with a focus on results achieved in the Graphene Flagship progr...    »
 
Fakultät:
Fakultät für Elektrotechnik und Informationstechnik 
Institut:
EIT 2 - Institut für Physik 
Professur:
Düsberg, Georg 
Projekt:
Graphene Flagship Core 3 
Open Access ja oder nein?:
Ja / Yes 
Sonstige Angaben:
Voraufnahme 
Volltext-Version:
Accepted Manuscript 
OA-Lizenz des Volltexts:
CC BY 4.0